A Fully Polarity-Aware Double-Node-Upset-Resilient Latch Design

Due to aggressive scaling down, multiple-node-upset hardened design has become a major concern regarding radiation hardening. The proposed latch overcomes the architecture and performance limitations of state-of-the-art double-node-upset (DNU)-resilient latches. A novel stacked element is developed with multiple thresholds, regular architecture, increased number single-event upset (SEU)-insensitive nodes, low power dissipation, high robustness. radiation-aware layout considering layout-level issues also proposed. Compared DNU-resilient latches, simulation results show that exhibits up 92% delay 80% reduction in data activity ratio (DAR) 100%. using dual-double exponential current source model shows strongest radiation-hardening capability among other